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Publications by José R. Celaya

Last Updated 10/10/2012

Journals:

  • J. R. Celaya, C. S. Kulkarni, G. Biswas, and K. Goebel, “Towards a model-based prognostics methodology for electrolytic capacitors: A case study based on electrical overstress accelerated aging,” International Journal of Prognostics and Health Management (Accepted), 2012.
  • X. Guan, Y. Liu, R. Jha, A. Saxena, J. Celaya, and K. Goebel, “Comparison of two probabilistic fatigue damage assessment approaches using prognostic performance metrics,” International Journal of Prognostics and Health Management, vol. 2-1, no. 6, 2011.
  • A. Saxena, J. Celaya, B. Saha, S. Saha, and K. Goebel, “Metrics for offline evaluation of prognostic performance,” International Journal of Prognostics and Health Management, vol. 1-1, no. 1, 2010.
  • N. Patil, J. Celaya, D. Das, K. Goebel, and M. Pecht, “Precursor parameter identification for insulated gate bipolar transistor (IGBT) prognostics,” IEEE Transactions on Reliability, vol. 58, no. 2, pp. 271–276, 2009.
  • J. Celaya, A. Desrochers, and R. Graves, “Modeling and analysis of multi-agent systems using Petri nets,” Journal of Computers, vol. 4, no. 10, pp. 981–996, 2009.
  • K. Goebel, B. Saha, A. Saxena, J. Celaya, and J. Christophersen, “Prognostics in battery health man- agement,” IEEE Instrumentation & Measurement Magazine, vol. 11, no. 4, pp. 33–40, 2008.

Conferences:

  • C. S. Kulkarni, J. R. Celaya, K. Goebel, and G. Biswas, “Bayesian framework approach for prognostic studies in electrolytic capacitor under thermal overstress conditions,” in Annual Conference of the Prognostics and Health Management Society, (Minneapolis, MN), September 2012.
  • C. S. Kulkarni, J. R. Celaya, G. Biswas, and K. Goebel, “Prognostics of power electronics, methods and validation experiments,” in IEEE AUTOTESTCON, 2012, (Anaheim, CA), September 2012.
  • C. S. Kulkarni, J. R. Celaya, G. Biswas, and K. Goebel, “Accelerated aging experiments for capacitor health monitoring and prognostics,” in IEEE AUTOTESTCON, 2012, (Anaheim, CA), September 2012.
  • J. R. Celaya, A. Saxena, and K. Goebel, “Uncertainty representation and interpretation in model-based prognostics algorithms based on kalman filter estimation,” in Annual Conference of the Prognostics and Health Management Society, (Minneapolis, MN), September 2012.
  • A. Saxena, J. R. Celaya, I. Roychoudhury, S. Saha, B. Saha, and K. Goebel, “Designing data-driven battery prognostic approaches for variable loading profiles: Some lessons learned,” in First European Conference of the PHM Society 2012 (PHM-E’12), (Dresden Germany), July 2012.
  • C. S. Kulkarni, J. R. Celaya, K. Goebel, and G. Biswas, “Physics based electrolytic capacitor degradation models for prognostic studies under thermal overstress,” in First European Conference of the PHM Society 2012 (PHM-E’12), (Dresden Germany), July 2012.
  • A. Saxena, I. Roychoudhury, J. Celaya, B. Saha, S. Saha, and K. Goebel, “Requirements flowdown for prognostics and health management,” in Infotech@Aerospace 2012, no. AIAA-2012-2554, (Garden Grove, California), June 19-21 2012.
  • C. Kulkarni, J. Celaya, G. Biswas, and K. Goebel, “Prognostics health management and physics based failure models for electrolytic capacitors,” in Infotech@Aerospace 2012, no. AIAA-2012-2602, (Garden Grove, California), June 19-21 2012.
  • S. Frost, K. Goebel, and J. Celaya, “A briefing on metrics and risks for autonomous decision-making in aerospace applications,” in Infotech@Aerospace 2012, no. AIAA-2012-2402, (Garden Grove, California), June 19-21 2012.
  • J. Celaya, A. Saxena, and K. Goebel, “A discussion on uncertainty representation and interpretation in model-based prognostics algorithms based on kalman filter estimation applied to prognostics of elec- tronics components,” in Infotech@Aerospace 2012, no. AIAA-2012-2422, (Garden Grove, California), June 19-21 2012.
  • A. E. Ginart, I. N. Ali, J. W. Goldin, P. W. Kalgren, M. J. Roemer, E. Balaban, and J. R. Celaya, “Signal and Characterization of EMI During Intermittent Connector Anomalies,” in IEEE Aerospace Conference, (Big Sky, MT), April 2012.
  • J. Celaya, C. Kulkarni, S. Saha, G. Biswas, and K. Goebel, “Accelerated Aging in Electrolytic Capacitors for Prognostics,” in The Annual Reliability and Maintainability Symposium (RAMS), (Reno, NV.), January 2012.
  • J. Celaya, A. Saxena, C. Kulkarni, S. Saha, and K. Goebel, “Prognostics Approach for Power MOS- FET under Thermal-Stress Aging,” in The Annual Reliability and Maintainability Symposium (RAMS), (Reno, NV.), January 2012.
  • C. Kulkarni, G. Biswas, J. Celaya, and K. Goebel, “A case study for capacitor prognostics under accel- erated degradation,” in IEEE Workshop on Accelerated Stress Testing & Reliability (ASTR), September 2011.
  • C. Kulkarni, G. Biswas, J. Celaya, and K. Goebel, “Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring,” in 8th International Workshop on Structural Health Monitoring (IWSHM), (Stanford University), September 2011.
  • J. R. Celaya, C. Kulkarni, G. Biswas, S. Saha, and K. Goebel, “A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging,” in Annual Conference of the Prognostics and Health Management Society, (Montreal QC, Canada), September 2011.
  • J. R. Celaya, A. Saxena, S. Saha, and K. Goebel, “Prognostics of Power MOSFETs under Thermal Stress Accelerated Aging using Data-Driven and Model-Based Methodologies,” in Annual Conference of the Prognostics and Health Management Society, (Montreal QC, Canada), September 2011.
  • E. Balaban, S. Narasimhan, M. Daigle, J. R. Celaya, I. Roychoudhury, B. Saha, S. Saha, and K. Goebel, “A Mobile Robot Testbed for Prognostics-Enabled Autonomous Decision Making,” in Annual Confer- ence of the Prognostics and Health Management Society, (Montreal QC, Canada), September 2011.
  • S. Saha, J. Celaya, V. Vashchenko, S. Mahiuddin, and K. Goebel, “Accelerated aging with electrical overstress and prognostics for power MOSFETs,” in Energytech, 2011 IEEE, pp. 1 –6, may 2011.
  • J. R. Celaya, S. Saha, and K. Goebel, “Electronics Health Management,” in NASA Aviation Safety Annual Technical Meeting, (St. Louis, MO), May 2011.
  • J. R. Celaya, C. Kulkarni, G. Biswas, and K. Goebel, “Towards prognostics of electrolytic capacitors,” in AIAA Infotech@Aerospace 2011, no. AIAA-2011-1519, (St. Louis, MO), Mar. 29-31 2011.
  • C. Kulkarni, G. Biswas, J. Celaya, and K. Goebel, “Prognostic techniques for capacitor degradation and health monitoring,” in The Maintenance and Reliability Conference (MARCON), (Knoxville, TN), February 2011.
  • J. R. Celaya, A. Saxena, V. Vashchenko, S. Saha, and K. Goebel, “Prognostics of power MOSFET,” in 23rd International Symposium on Power Semiconductor Devices and ICs, (San Diego, CA), 2011.
  • S. P. Bharadwaj, A. E. Ginart, I. N. Ali, P. W. Kalgren, J. Celaya, and S. Poll, “Solar cells aging estimation based on impedance characterization,” in IEEE Aerospace Conference 2011, (Big Sky, MT), 2011.
  • A. Saxena, I. Roychoudhury, J. Celaya, S. Saha, B. Saha, and K. Goebel, “Requirements specification for prognostics performance – an overview,” in AIAA Infotech@Aerospace 2010, no. AIAA-2010-3398, (Atlanta, Georgia), Apr. 20-22 2010.
  • C. Kulkarni, G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya, “Physics of Failure Models for Capac- itor Degradation in DC-DC Converters,” in The Maintenance and Reliability Conference (MARCON), (Knoxville, TN), February 2010.
  • A. Saxena, J. Celaya, B. Saha, S. Saha, and K. Goebel, “Evaluating prognostics performance for al- gorithms incorporating uncertainty estimates,” in IEEE Aerospace Conference, 2010, (Big Sky, MT), pp. 1–11, 2010.
  • S. Saha, J. Celaya, B. Saha, P. Wysocki, and K. Goebel, “Towards modeling the effects of lightning injection on power MOSFETs,” in Annual Conference of the Prognostics and Health Management Society 2010, (Portland, OR), 2010.
  • C. Kulkarni, G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, “Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring,” in IEEE AUTOTESTCON, 2010, (Orlando, FL), 2010.
  • C. Kulkarni, G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, “Aging methodologies and prognostic health management for electrolytic capacitors,” in Annual Conference of the Prognostics and Health Management Society 2010, (Portland, OR), 2010.
  • C. Kulkarni, G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, “Diagnostic/prognostic experiments for capacitor degradation and health monitoring in DC-DC converters,” in ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems (SMASIS 2010), (Philadelphia, PA), p. 3862, 2010.
  • A. E. Ginart, I. N. Ali, J. R. Celaya, P. W. Kalgren, D. P. S, and M. J. Roemer, “Modeling SiO2 ion impurities aging in insulated gate power devices under temperature and voltage stress,” in Annual Conference of the Prognostics and Health Management Society 2010, (Portland, OR), 2010.
  • J. R. Celaya, P. Wysocki, V. Vashchenko, S. Saha, and K. Goebel, “Accelerated aging system for prognostics of power semiconductor devices,” in IEEE AUTOTESTCON, 2010, (Orlando, FL), pp. 1– 6, 2010.
  • J. Celaya, A. Saxena, P. Wysocki, S. Saha, and K. Goebel, “Towards prognostics of power MOSFETs: Accelerated aging and precursors of failure,” in Annual Conference of the Prognostics and Health Man- agement Society 2010, (Portland, OR), 2010.
  • P. Wysocki, V. Vashchenko, J. Celaya, S. Saha, and K. Goebel, “Effect of electrostatic discharge on electrical characteristics of discrete electronic components,” in Annual Conference of the Prognostics and Health Management Society, 2009, (San Diego, CA), 2009.
  • A. Saxena, J. Celaya, B. Saha, S. Saha, and K. Goebel, “On applying the prognostics performance metrics,” in Annual Conference of the Prognostics and Health Management Society, 2009, (San Diego, CA), 2009.
  • A. Saxena, J. Celaya, B. Saha, S. Saha, and K. Goebel, “Evaluating algorithm performance metrics tailored for prognostics,” in Aerospace conference, 2009 IEEE, (Big Sky, MT), pp. 1–13, 2009.
  • B. Saha, J. R. Celaya, P. F. Wysocki, and K. F. Goebel, “Towards prognostics for electronics compo- nents,” in IEEE Aerospace conference 2009, (Big Sky, MT), pp. 1–7, 2009.
  • X. Guan, Y. Liu, A. Saxena, J. Celaya, and K. Goebel, “Entropy-based probabilistic fatigue damage prognosis and algorithmic performance comparison,” in Annual Conference of the Prognostics and Health Management Society, 2009, (San Diego, CA), 2009.
  • J. R. Celaya, S. Saha, P. Wyscoki, and K. F. Goebel, “Effects of lightning injection on power- MOSFETs,” in Annual Conference of the Prognostics and Health Management Society, 2009, (San Diego, CA), 2009.
  • J. R. Celaya, N. Patil, S. Saha, P. Wyscoki, and K. Goebel, “Towards accelerated aging methodologies and health management of power MOSFETs,” in Annual Conference of the Prognostics and Health Management Society, 2009, (San Diego, CA), 2009.
  • G. Sonnenfeld, K. Goebel, and J. R. Celaya, “An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors,” in IEEE AUTOTESTCON 2008, pp. 208–215, 2008.
  • A. Saxena, J. Celaya, E. Balaban, K. Goebel, B. Saha, S. Saha, and M. Schwabacher, “Metrics for evaluating performance of prognostic techniques,” in International Conference on Prognostics and Health Management, 2008. PHM 2008., (Denver, CO), pp. 1–17, 2008.
  • K. Goebel, B. Saha, A. Saxena, and J. Celaya, “A comparison of data-driven algorithms for prognostics,” in Conference on Intelligent Data Understanding (CIDU), (Washington DC), 2008.
  • R. Subbu, G. Russo, K. Chalermkraivuth, and J. Celaya, “Multi-criteria set partitioning for portfolio management: A visual interactive method,” in IEEE Symposium on Computational Intelligence in Multicriteria Decision Making, (Honolulu, HI), pp. 166–171, 2007.
  • J. R. Celaya, A. A. Desrochers, and R. J. Graves, “Modeling and analysis of multi-agent systems using petri nets,” in IEEE International Conference on Systems, Man and Cybernetics, 2007. ISIC., (Montreal, Que.), pp. 1439–1444, 2007.
  • K. F. Goebel, W. Yan, N. H. W. Eklund, X. Hu, V. Avasarala, and J. Celaya, “Defect classification of highly noisy NDE data using classifier ensembles,” in Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications, vol. 6167, (San Diego, CA), pp. 61671O–12, SPIE, 2006.
  • V. Avasarala, J. R. Celaya, K. Goebel, and N. Eklund, “Sensor validation in non-destructive evaluation using clustering,” in Smart Structures and Materials 2006: Smart Sensor Monitoring Systems and Applications, vol. 6167, (San Diego, CA), SPIE, 2006.

Technical Reports:

  • J. J. Ely, T. X. Nguyen, G. N. Szatkowski, S. V. Koppen, J. J. Mielnik, R. K. Vaughan, P. F. Wysocki, J. R. Celaya, and S. Saha, “Lightning pin injection test: MOSFETS in “ON” state,” Tech. Rep. NASA/TM-2011-217047, NASA Technical Memorandum, 2011.
  • J. J. Ely, T. X. Nguyen, G. N. Szatkowski, S. V. Koppen, J. J. Mielnik, R. K. Vaughan, P. F. Wysocki, J. R. Celaya, and S. Saha, “Lightning pin injection testing on MOSFETS,” Tech. Rep. NASA/TM-2009- 215794, NASA Technical Memorandum, 2009.
  • K. Goebel, J. Celaya, and V. Avasarala, “ESCD automated classification - 2005 activities,” GE Internal (Class 2) 2006GRC412, General Electric Global Research Center, June 2006.
  • K. Goebel, D. Chan, S. Dewangan, T. Johnson, K. Kutty, J. Celaya, T. Markham, M. Prakash, M. Dinesh, M. Osborn, T. Sebastian, D. Fogelman, K. Lilienfeld, and M. Zahn, “Automated data analysis for USWM defect detection, EMAT defect discrimination, MFL sizing, and USCD defect classification,” GE Internal (Class 2) 2006GRC411, General Electric Global Research Center, June 2006.
  • P. Ayyalasomayajula, J. Celaya, Z. Li, A. Petrie, K. Satyam, and T. Willemain, “New approaches to confirming bimodality in histograms,” Tech. Rep. Decision Science and Engineering Systems Department 38-06-524, Rensselaer Polytechnic Institute, April 2006.

Contact

José R. Celaya, PhD
Research Scientist, (SGT Inc.)
Prognostics Center of Excellence
Intelligent Systems Division

NASA Ames Research Center
Mail Stop 269-4
Moffett Field, CA 94035

Phone: 650-604-4596

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